The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2010

Filed:

Mar. 06, 2006
Applicants:

John Chamberlain Robb, Newburyport, MA (US);

Steven W. Arms, Williston, VT (US);

Christopher P. Townsend, Shelburne, VT (US);

David L. Churchill, Burlington, VT (US);

Michael J. Hamel, Essex Junction, VT (US);

Inventors:

John Chamberlain Robb, Newburyport, MA (US);

Steven W. Arms, Williston, VT (US);

Christopher P. Townsend, Shelburne, VT (US);

David L. Churchill, Burlington, VT (US);

Michael J. Hamel, Essex Junction, VT (US);

Assignee:

MicroStrain, Inc., Williston, VT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 5/30 (2006.01); G01D 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An electronic system for testing a material includes at least one module for mechanically mounting on the material. The module includes a signal generator for generating a signal generator signal. The module also includes a stimulus signal delivering device (SSDD) and an SSDD circuit for providing a device signal derived from said signal generator signal to the material. The module also includes a sensor and a sensor circuit for receiving an interaction signal derived from interaction of the device signal with the material.


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