The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2010
Filed:
Dec. 03, 2004
Siming Lin, Austin, TX (US);
Kevin M. Crotty, Austin, TX (US);
Nicolas Vazquez, Austin, TX (US);
National Instruments Corporation, Austin, TX (US);
Abstract
System and method for analyzing an image. A received image, comprising an object or objects, is optionally preprocessed. Invariant shape features of the object(s) are extracted using a generalized invariant feature descriptor. The generalized invariant feature descriptor may comprise a generalized invariant feature vector comprising components corresponding to attributes of each object, e.g., related to circularity, elongation, perimeter-ratio-based convexity, area-ratio-based convexity, hole-perimeter-ratio, hole-area-ratio, and/or functions of Hu Moment 1 and/or Hu Moment 2. Non-invariant features, e.g., scale and reflection, may be extracted to form corresponding feature vectors. The object is classified by computing differences between the generalized invariant feature vector (and optionally, non-invariant feature vectors) and respective generalized invariant feature vectors corresponding to reference objects, determining a minimum difference corresponding to a closest reference object or class of reference objects of the plurality of reference objects, and outputting an indication of the closest reference object or class as the classification.