The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2010
Filed:
Aug. 30, 2006
Naoki Fukaya, Obu, JP;
Hironobu Fujiyoshi, Kasugai, JP;
Yuusuke Sakashita, Kakamigahara, JP;
Hisanori Takamaru, Nagoya, JP;
Naoki Fukaya, Obu, JP;
Hironobu Fujiyoshi, Kasugai, JP;
Yuusuke Sakashita, Kakamigahara, JP;
Hisanori Takamaru, Nagoya, JP;
Denso Corporation, Kariya, JP;
Abstract
A method for detecting an ellipsoid includes: extracting an ellipsoid candidate; extracting an ellipsoid contour; calculating an ellipsoid parameter; calculating an adaptability ratio; and eliminating the ellipsoid candidate. Extracting the ellipsoid candidate includes: inputting an image with figures; selecting the ellipsoid candidate from the figures; and extracting a contour candidate point and a center point. Extracting the ellipsoid contour includes: drawing straight lines; determining contour candidate points; calculating first and second distances; and defining ellipsoid contour points. Calculating the ellipsoid parameter is based on the ellipsoid contour points and the center point. Calculating the adaptability ratio includes: drawing a complete ellipsoid; and calculating the adaptability ratio between the complete ellipsoid and the ellipsoid candidate. Eliminating the ellipsoid candidate is performed when the adaptability ratio is equal to or smaller than a threshold.