The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2010

Filed:

Jun. 17, 2005
Applicants:

Chun-nan Chen, Taipei, TW;

Wen-yi Wu, Hsin-Chu Hsien, TW;

Pi-hai Liu, Taipei, TW;

Inventors:

Chun-Nan Chen, Taipei, TW;

Wen-Yi Wu, Hsin-Chu Hsien, TW;

Pi-Hai Liu, Taipei, TW;

Assignee:

MediaTek Incorporation, Hsin-Chu Hsien, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method utilized for detecting a physical mark in a signal read from an optical disc, including: generating a matching signal capable of being utilized to identify the physical mark according to a reference clock and a wobble clock; generating a comparison signal by comparing the matching signal and a wobble data signal; determining whether a period of which the level of the comparison signal surpass a predetermined level within a predetermined period is greater than a threshold or not; and if the period greater than the threshold, generating an indication signal corresponding to the location of the physical mark. Wherein the wobble data signal and the wobble clock is generated according to the read back signal.


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