The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2010
Filed:
Aug. 26, 2004
Takashi Yamada, Tokyo, JP;
Tsuyoshi Komaki, Tokyo, JP;
Takashi Yamada, Tokyo, JP;
Tsuyoshi Komaki, Tokyo, JP;
TDK Corporation, Tokyo, JP;
Abstract
A warpage angle measurement apparatus and a warpage angle measurement method are provided that can measure an angle of warpage of an optical disc and a cartridge for the optical disc caused by a rapid environmental change such as a temperature change or a humidity change in a short time. The warpage angle measurement apparatusincludes: a constant temperature chamberfor accommodating an optical recording mediumformed by mounting the optical discas an object to be measured in the cartridgeand for adjusting a surrounding of the optical recording mediumto have a predetermined environmental condition; a laser oscillatorfor causing laser oscillation to emit laser light to the optical disc; and a light-receiving unitfor receiving the laser light reflected from the optical discand detecting a relative angle of an optical path Lof the reflected laser light with respect to an optical path Lof the emitted laser light.