The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2010

Filed:

Nov. 06, 2007
Applicants:

Gary D. Carpenter, Austin, TX (US);

Fadi H. Gebara, Austin, TX (US);

Jerry C. Kao, Ann Arbor, MI (US);

Jente B Kuang, Austin, TX (US);

Kevin J. Nowka, Georgetown, TX (US);

Liang-teck Pang, Albany, CA (US);

Inventors:

Gary D. Carpenter, Austin, TX (US);

Fadi H. Gebara, Austin, TX (US);

Jerry C. Kao, Ann Arbor, MI (US);

Jente B Kuang, Austin, TX (US);

Kevin J. Nowka, Georgetown, TX (US);

Liang-Teck Pang, Albany, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 8/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A storage array including a local clock buffer with programmable timing provides a mechanism for evaluating circuit timing internal to the storage array. The local clock buffer can independently adjust the pulse width of a local clock that controls the wordline and local bitline precharge pulses and the pulse width of a delayed clock that controls the global bitline precharge, evaluate and read data latching. The delay between the local clock and the delayed clock can also be adjusted. By varying the pulse widths of the local and delayed clock signal, along with the inter-clock delay, the timing margins of each cell in the array can be evaluated by reading and writing the cell with varying pulse width and clock delay. The resulting evaluation can be used to evaluate timing margin variation within a die, as well variation from die-to-die and under varying environments, e.g., voltage and temperature variation.


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