The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2010
Filed:
Dec. 31, 2008
Yoshiaki Nishio, Osaka, JP;
Yoshiaki Nishio, Osaka, JP;
Keyence Corporation, Osaka, JP;
Abstract
The present invention provides an optical displacement meter which performs a profile search for performing positional adjustment of a profile shape. The optical displacement meter includes: an amplifier for amplifying a reception light signal from a two-dimensional light receiving device; profile computing means capable of computing a profile shape of the object to be measured on the basis of an amplification signal obtained by the amplifier in a point in the first direction by the reflection light of the light emitted from the projector; a display unit capable of displaying the profile shape of the object to be measured computed by the profile computing means; registered-profile designating means for designating a registered profile as a reference of a profile search from profile shapes displayed on the display unit; and profile matching means for performing a profile search to find a match between an input profile shape and the registered profile designated by the registered profile designating means and, on the basis of a result of the profile search, rotating or moving the input profile shape.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile