The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2010

Filed:

Sep. 21, 2006
Applicants:

Adrian A. Dorrington, Hamilton, NZ;

Thomas W. Jones, Smithfield, VA (US);

Paul M. Danehy, Newport News, VA (US);

Kent A. Watson, New Kent, VA (US);

John W. Connell, Yorktown, VA (US);

Richard S. Pappa, Newport News, VA (US);

W. Keith Belvin, Wicomico, VA (US);

Inventors:

Adrian A. Dorrington, Hamilton, NZ;

Thomas W. Jones, Smithfield, VA (US);

Paul M. Danehy, Newport News, VA (US);

Kent A. Watson, New Kent, VA (US);

John W. Connell, Yorktown, VA (US);

Richard S. Pappa, Newport News, VA (US);

W. Keith Belvin, Wicomico, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2006.01);
U.S. Cl.
CPC ...
Abstract

A photogrammetric system uses an array of spaced-apart targets coupled to a structure. Each target exhibits fluorescence when exposed to a broad beam of illumination. A photogrammetric imaging system located remotely with respect to the structure detects and processes the fluorescence (but not the illumination wavelength) to measure the shape of a structure.


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