The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2010

Filed:

Jul. 11, 2006
Applicants:

Charles Grant Myers, Corvallis, OR (US);

Jeffery Steven Beck, Philomath, OR (US);

Inventors:

Charles Grant Myers, Corvallis, OR (US);

Jeffery Steven Beck, Philomath, OR (US);

Assignee:

Aptina Imaging Corporation, Grand Cayman, KY;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/217 (2006.01); H04N 5/228 (2006.01);
U.S. Cl.
CPC ...
Abstract

A delay circuit is provided that delays the sampling signal by a selected amount in order to ensure that sampling does not occur concurrently with the occurrence of a noisy event. The noisy events on the IC tend to be periodic and occur at regular intervals. The invention allows the delay in the sampling signal to be adjusted such that sampling does not occur at the same time as the reoccurring noisy event. This ensures that the sample signals will not have noise in them resulting from the occurrence of the noisy event. In addition, the delay circuit is programmable to allow the amount of delay to be set on the fly.


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