The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2010

Filed:

Jan. 20, 2006
Applicants:

John D. Hyde, Corvallis, OR (US);

Jay A. Kuhn, Seattle, WA (US);

Ronald L. Koepp, Lynnwood, WA (US);

Ronald E. Paulsen, Woodinville, WA (US);

Inventors:

John D. Hyde, Corvallis, OR (US);

Jay A. Kuhn, Seattle, WA (US);

Ronald L. Koepp, Lynnwood, WA (US);

Ronald E. Paulsen, Woodinville, WA (US);

Assignee:

Impinj, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/58 (2006.01);
U.S. Cl.
CPC ...
Abstract

Microcircuits may include polysilicon features that are vulnerable to defects due to undesirable phenomena during manufacturing processes such as, inter alia, over-etching. The same phenomena that may cause defects can be exploited to automatically isolate the affected circuit and thus limit the harm caused by defects or incipient defects.


Find Patent Forward Citations

Hyde, John. (2010). Automatic on-die defect isolation (U.S. Patent No. 7667231). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7667231

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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