The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2010
Filed:
Dec. 04, 2006
Motoo Noritake, Ichinomiya, JP;
Takao Ohnishi, Nishikasugai-Gun, JP;
Toshikazu Hirota, Nagoya, JP;
NGK Insulators, Ltd., Nagoya, JP;
Abstract
A method of producing a microarray including: (A) ejecting a liquid sample from an outlet onto an inspection carrier to form inspection spots, inspecting the resultant inspection spots for their quality to determine whether the inspected spots are defective or successful, and detecting a defective discharge unit, if any; (B) making the detected defective discharge unit stop discharging the liquid sample to prevent formation of the defective sample spot; (C) forming successful sample spots on a carrier using successful discharge units to provide a successful microarray on which the successful spots are aligned in a predetermined pattern on the carrier; and (D) forming a successful spot to be formed originally on the successful microarray at the position of the defective spot where no spot is formed in step (B).