The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2010

Filed:

Mar. 23, 2007
Applicants:

Kai Cheng, Heverlee, BE;

Maarten Leys, Eindhoven, NL;

Stefan Degroote, Scherpenheuvel-Zichem, BE;

Inventors:

Kai Cheng, Heverlee, BE;

Maarten Leys, Eindhoven, NL;

Stefan Degroote, Scherpenheuvel-Zichem, BE;

Assignees:

IMEC, Leuven, BE;

Katholieke Universiteit Leuven (KUL), Leuven, BE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/20 (2006.01); H01L 23/58 (2006.01);
U.S. Cl.
CPC ...
Abstract

Semiconductor process technology and devices are provided, including a method for forming a high quality group III nitride layer on a silicon substrate and to a device obtainable therefrom. According to the method, a pre-dosing step is applied to a silicon substrate, wherein the substrate is exposed to at least 0.01 μmol/cmof one or more organometallic compounds containing Al, in a flow of less than 5 μmol/min. The preferred embodiments are equally related to the semiconductor structure obtained by the method, and to a device comprising said structure.


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