The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2010

Filed:

Feb. 10, 2005
Applicants:

David E. Brown, Pleasant Valley, NY (US);

Hans Van Meer, Fishkill, NY (US);

Sey-ping Sun, Poughkeepsie, NY (US);

Inventors:

David E. Brown, Pleasant Valley, NY (US);

Hans Van Meer, Fishkill, NY (US);

Sey-Ping Sun, Poughkeepsie, NY (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/8238 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for forming different active thicknesses on the same silicon layer includes masking the silicon layer and exposing selected regions of the silicon layer. The thickness of the silicon layer at the exposed regions is changed, either by adding silicon or subtracting silicon from the layer at the exposed regions. Once the mask is removed, the silicon layer has regions of different active thicknesses, respectively suitable for use in different types of devices, such as diodes and transistors.


Find Patent Forward Citations

Brown, David. (2010). Method for forming semiconductor devices with active silicon height variation (U.S. Patent No. 7666735). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7666735

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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