The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2010
Filed:
May. 05, 2004
Applicants:
Yair Alster, Tel-Aviv, IL;
Omer Rafaeli, Tel-Aviv, IL;
Edward Elikhis, Raanana, IL;
Inventors:
Assignee:
Reichert, Inc., Depew, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of providing an eye diagnosis. The method includes displaying stimuli to a patient, receiving indications of locations in which the stimuli were perceived by the patient, analyzing the spatial relationship between at least some of the received indicated locations and classifying the patient with regard to a retinal related disease, at least partially based on the spatial analysis.
Alster, Yair. (2010). Eye mapping (U.S. Patent No. 7665847). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7665847
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile