The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2010

Filed:

Jan. 11, 2007
Applicants:

Arthur Ho, Coogee, AU;

Earl Leo Smith, Iii, Houston, TX (US);

Padmaja Sankaridurg, Marboubra, AU;

Brien Anthony Holden, Kingsford, AU;

Inventors:

Arthur Ho, Coogee, AU;

Earl Leo Smith, III, Houston, TX (US);

Padmaja Sankaridurg, Marboubra, AU;

Brien Anthony Holden, Kingsford, AU;

Assignee:

Institute for Eye Research, Sydney, New South Wales, AU;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02C 7/02 (2006.01); A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus are disclosed for controlling optical aberrations to alter relative curvature of field by providing optical devices and methods comprising the repositioning of peripheral off-axis focal points relative to the retina to produce stimulus for influencing the progression of refractive error while simultaneously controlling the position of the central focal point near to the retina to provide clear central vision and simultaneously providing zones of controlled peripheral defocus and other optical aberrations to improve peripheral vision for select directions of gaze.


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