The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7665367 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 23, 2010

Filed:

Jan. 28, 2008
Applicants:

Hitoshi Mishiro, Chiyoda-ku, JP;

Atsushi Nakamura, Chiyoda-ku, JP;

Inventors:

Hitoshi Mishiro, Chiyoda-ku, JP;

Atsushi Nakamura, Chiyoda-ku, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for measuring the shape of a heating treatment jig to be held by a holding portion of a vertical heat treatment apparatus includes measuring the shape of the heat treatment jig in a state that the position of a supporting portion for supporting the heat treatment jig is set to be the same as the position of the holding portion for the heat treatment jig in the vertical heat treatment apparatus. The heat treatment jig can be used for placing a semiconductor wafer to be subjected to heat treatment.


Find Patent Forward Citations

Mishiro, Hitoshi. (2010). Method and apparatus for measuring shape of heat treatment jig (U.S. Patent No. 7665367). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7665367

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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