The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2010

Filed:

Sep. 15, 2003
Applicants:

Yoav Hollander, Kiryat Ono, IL;

Yaron Kashai, Sunnyvale, CA (US);

Inventors:

Yoav Hollander, Kiryat Ono, IL;

Yaron Kashai, Sunnyvale, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for generalized scenarios, for automatically generating tests. The tests are generated from some underlying structure, such as one or more scenarios. The scenarios preferably include a plurality of constraints for generating a test program for generating input values to the test generation process. The scenarios provide a more generalized method for generating tests.


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