The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2010
Filed:
Sep. 03, 2004
Graham Stephen Wood, El Granada, CA (US);
Alex Tsukerman, Foster City, CA (US);
Richard Sarwal, Portola Valley, CA (US);
Gary Ngai, Saratoga, CA (US);
Mark Ramacher, San Carlos, CA (US);
Leng Leng Tan, Sunnyvale, CA (US);
Graham Stephen Wood, El Granada, CA (US);
Alex Tsukerman, Foster City, CA (US);
Richard Sarwal, Portola Valley, CA (US);
Gary Ngai, Saratoga, CA (US);
Mark Ramacher, San Carlos, CA (US);
Leng Leng Tan, Sunnyvale, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
Systems and methods to define and store performance baselines. A baseline may be defined as a pair of snapshots, each snapshot containing the same set of statistics and having a timestamp value associated therewith. The present invention allows for the designation, automatically or manually, of statistics collected over a certain period of time to be stored and used for comparison. Baselines may be used, for example, to manually or automatically compare with current system performance, compare difference-difference values and set thresholds to monitor current system performance.