The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2010

Filed:

Jun. 04, 2007
Applicants:

Hisashi Kameya, Kariya, JP;

Kenichiro Hidaka, Aichi-ken, JP;

Inventors:

Hisashi Kameya, Kariya, JP;

Kenichiro Hidaka, Aichi-ken, JP;

Assignee:

Denso Corporation, Kariya, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A fault detection unit detects a fault occurred in a detecting device which detects a rotational angle of a rotor with respect to a stator from sine and cosine wave signals having amplitudes modulated in a sinusoidal wave shape in a cycle of rotation of the rotor. The unit produces a judging value from the signals, judges occurrence of a fault from the value placed out of a normal range, and judges the device to be in a tentative fault state when the judgment is continued. After this judgment, when the rotational angle is changed over its entire range while the value is placed within the normal range, the unit judges the device to have returned to a normal state. In contrast, when the judgment is still continued, the unit judges the device to be in a determinate fault state and decides the occurrence of the fault.


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