The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7664618 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 16, 2010

Filed:

Dec. 17, 2004
Applicants:

Wan Sup Cheung, Daejeon, KR;

Jong Yeon Lim, Daejeon, KR;

Kwang Hwa Chung, Daejeon, KR;

Soo Gab Lee, Seoul, KR;

Inventors:

Wan Sup Cheung, Daejeon, KR;

Jong Yeon Lim, Daejeon, KR;

Kwang Hwa Chung, Daejeon, KR;

Soo Gab Lee, Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G21C 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention such as active diagnostic algorithms is developed not only to realize the early detection of degraded vacuum pumps for the protection of pump failure but also to provide their predictive maintenance. According to the present invention, it is possible to find simple and effective ways to deal with technical problems arising from the large variability of the pump-by-pump operation characteristics and the multiple process conditions where pumps run under the idle operation and gas-loaded operation conditions alternately, especially in semiconductor manufacturing process.


Find Patent Forward Citations

Cheung, Wan. (2010). Trend monitoring and diagnostic analysis method and system for failure protection and for predictive maintenance of a vacuum pump (U.S. Patent No. 7664618). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7664618

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