The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2010

Filed:

Dec. 02, 2002
Applicants:

John J. Heine, New Port Richey, FL (US);

Robert P. Velthuizen, Livingston, NJ (US);

Jerry Alan Thomas, Potomac, MD (US);

Inventors:

John J. Heine, New Port Richey, FL (US);

Robert P. Velthuizen, Livingston, NJ (US);

Jerry Alan Thomas, Potomac, MD (US);

Assignee:

University of South Florida, Tampa, FL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention is a method of determining breast cancer risk including the steps of establishing a risk probably value associated with a patient, the risk probability value calculated from an array of risk factors associated with breast cancer, applying a computer algorithm adapted to find abnormalities in the patient's mammogram, and increasing the tolerance level for false positive results in the computer algorithm responsive to a higher probability value associated with the patient and decreasing the tolerance level for false positive results in the computer algorithm responsive to a lower probability value associated with the patient.


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