The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2010
Filed:
May. 11, 2007
Robert Speller, Croddington, GB;
Gary Royle, London, GB;
Robert Speller, Croddington, GB;
Gary Royle, London, GB;
UCL Business PLC, London, GB;
Abstract
A method and an arrangement for an intelligent adaptive x-ray imaging system, in which the exposure conditions of the object to x-rays is dynamically controlled and optimized in real-time in order to provide the optimum diagnostic information. The arrangement splits the imaging beam into two separate fan beams that scan over the object in a single pass, where the first beam (scout) collects information from the object, that is analyzed to control the intensity or spectral quality or spatial distribution of the second beam (I-ImaS). The CMOS image sensors deployed in the arrangement are able to process detected information either on-chip or within a field programmable gate array, so as to compute a measure related to the diagnostic value of the information.