The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2010
Filed:
Dec. 05, 2007
Applicant:
Atsushi Yonetani, Ina, JP;
Inventor:
Atsushi Yonetani, Ina, JP;
Assignee:
Olympus Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/02 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A microscope objective includes, in order from the object side, a first lens unit with positive refracting power, having two meniscus lenses, each with a concave surface facing the object side, and at least one positive lens; a second lens unit with positive refracting power; and a third lens unit having concave surfaces adjacent and opposite to each other configured as air contact surfaces. The microscope objective satisfies the following conditions:7≦f0.5<NAwhere f is the focal length (mm) of the microscope objective and NA is the numerical aperture of the microscope objective on the entrance side.