The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2010
Filed:
Jul. 11, 2007
Tokiko Inoue, Fukuchiyama, JP;
Yusuke Iida, Ayabe, JP;
Tatsuya Matsunaga, Fukuchiyama, JP;
Hitoshi Oba, Fukuchiyama, JP;
Tokiko Inoue, Fukuchiyama, JP;
Yusuke Iida, Ayabe, JP;
Tatsuya Matsunaga, Fukuchiyama, JP;
Hitoshi Oba, Fukuchiyama, JP;
Omron Corporation, Kyoto-Shi, JP;
Abstract
An image taken by an imaging device is displayed on a display unit. When a confirmation instruction is inputted through an input unit, image teaching is performed while the image displayed on the display unit is set to a setting object image. A measurement item which is of a candidate of a measurement process including specification of a reference position is displayed as the measurement process to accept selection. Specification of cutout area which constitutes one measurement target region is accepted, a measurement point including a local region or a feature point which is used for the measurement is automatically set in the measurement target region based on pieces of information on the set measurement process and reference position.