The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2010
Filed:
Sep. 27, 2006
Wei LI, Edmonton, CA;
Ross Chow, Sherwood Park, CA;
Jim Boyd Curtis, Edmonton, CA;
Xiaocai Joyce Chen, Edmonton, CA;
Wei Li, Edmonton, CA;
Ross Chow, Sherwood Park, CA;
Jim Boyd Curtis, Edmonton, CA;
Xiaocai Joyce Chen, Edmonton, CA;
Alberta Research Council Inc., Edmonton, CA;
Abstract
A method for obtaining a reflectance property indication of a sample which includes making a reflectance measurement of the sample and correcting the reflectance measurement in order to obtain the reflectance property indication. The reflectance measurement represents an observed reflectance of the sample, the reflectance property indication represents a standardized reflectance of the sample, and correcting the reflectance measurement accounts for a difference between the standardized reflectance and the observed reflectance. An apparatus for making a reflectance measurement of a sample which includes a housing defining a viewing port, a temperature control mechanism for controlling the temperature within the interior of the housing, and an optical reflectometer contained within the interior of the housing. The reflectometer has a measurement direction and is movable within the housing so that the measurement direction can be selectively aligned with the viewing port.