The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2010

Filed:

Oct. 04, 2007
Applicants:

Marc Lévesque, Saint-Augustin-de-Desmaures, CA;

Alain Cournoyer, Québec, CA;

Inventors:

Marc Lévesque, Saint-Augustin-de-Desmaures, CA;

Alain Cournoyer, Québec, CA;

Assignee:

Institut National D'Optique, Sainte-Foy, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/63 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method to improve the accuracy of the measure of constituent element(s) in a sample containing domains potentially including the constituent element(s) are described herein. For each domain, the volume of the domain is estimated and the concentration of the constituent element(s) in the domain is determined using LIBS. When all the domains have been analyzed, the volumetric concentration of the domains is summed and divided by the total volume of the sample. Accordingly, by limiting the concentration analysis to separate domains, it is possible to improve the accuracy of the concentration analysis.


Find Patent Forward Citations

Lévesque, Marc. (2010). Method and system to measure the concentration of constituent elements in an inhomogeneous material using libs (U.S. Patent No. 7663749). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7663749

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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