The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2010
Filed:
Feb. 09, 2007
Kamran UZ Zaman, Pittsford, NY (US);
Stanley Pietrzykowski, Brighton, NY (US);
Dante Pietrantoni, Rochester, NY (US);
Kenneth Gottschalk, West Henrietta, NY (US);
Richard Schichler, Rochester, NY (US);
Kamran Uz Zaman, Pittsford, NY (US);
Stanley Pietrzykowski, Brighton, NY (US);
Dante Pietrantoni, Rochester, NY (US);
Kenneth Gottschalk, West Henrietta, NY (US);
Richard Schichler, Rochester, NY (US);
Xerox Corporation, Norwalk, CT (US);
Abstract
A method for detecting specular surface flaws on a coated substrate includes impinging visible non-integrated electromagnetic radiation from a first source onto the coated substrate, reflecting the visible non-integrated electromagnetic radiation off the coated substrate into a first photosensitive device, forming a recorded high frequency surface flaw image, and impinging visible coherent electromagnetic radiation from a second source onto a coated substrate at an oblique angle. The visible non-integrated electromagnetic radiation and the visible coherent electromagnetic radiation on the coated substrate are collocated but not combined on the substrate. The visible coherent electromagnetic radiation is reflected off the coated substrate onto a screen material to form a low frequency surface flaw image. The low frequency surface flaw image is recorded to form a recorded low frequency surface flaw image.