The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2010
Filed:
Dec. 05, 2005
George G Robertson, Seattle, WA (US);
Daniel C Robbins, Seattle, WA (US);
Desney S Tan, Kirkland, WA (US);
Kenneth P Hinckley, Redmond, WA (US);
Maneesh Agrawala, Seattle, WA (US);
Mary P Czerwinski, Woodinville, WA (US);
Patrick Markus Baudisch, Seattle, WA (US);
Gonzalo a Ramos, Toronto, CA;
George G Robertson, Seattle, WA (US);
Daniel C Robbins, Seattle, WA (US);
Desney S Tan, Kirkland, WA (US);
Kenneth P Hinckley, Redmond, WA (US);
Maneesh Agrawala, Seattle, WA (US);
Mary P Czerwinski, Woodinville, WA (US);
Patrick Markus Baudisch, Seattle, WA (US);
Gonzalo A Ramos, Toronto, CA;
Microsoft Corporation, Redmond, WA (US);
Abstract
Providing axonometric views of layers containing objects while preserving the visual attributes of the objects is disclosed. A group of objects, e.g., overlapping objects, is determined. Layer dimensions are calculated such that each object in the group is encompassed by a layer. Objects are placed in the layers and the layers are displayed in axonometric views. Visual cues to indicate selected layers are provided. Controls to adjust the depth of the layers and to enable moving objects in the selected layer are also provided.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile