The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2010
Filed:
Aug. 30, 2006
Chi-kuang Hwang, Hsin Chu, TW;
In-hang Chung, Hsin Chu, TW;
Chih-hu Wang, Hsin Chu, TW;
Ching-cheng Tien, Hsin Chu, TW;
Bore-kuen Lee, Hsin Chu, TW;
Tung-chou Chen, Hsin Chu, TW;
Chia-wen Wu, Hsin Chu, TW;
Chien-jung Chiu, Hsin Chu, TW;
Ming-ching Yen, Hsin Chu, TW;
Jwu-e Chen, Hsin Chu, TW;
Chi-Kuang Hwang, Hsin Chu, TW;
In-Hang Chung, Hsin Chu, TW;
Chih-Hu Wang, Hsin Chu, TW;
Ching-Cheng Tien, Hsin Chu, TW;
Bore-Kuen Lee, Hsin Chu, TW;
Tung-Chou Chen, Hsin Chu, TW;
Chia-Wen Wu, Hsin Chu, TW;
Chien-Jung Chiu, Hsin Chu, TW;
Ming-Ching Yen, Hsin Chu, TW;
Jwu-E Chen, Hsin Chu, TW;
Chung Hua University, Hsin Chu, TW;
Abstract
Disclosed is a substrate damage detection mechanism using Radio Frequency Identification (RFID) tag including a substrate, at least one RFID tag with a RFID chip, a RFID transmitter and at least one data input/output port and at least one conducting circuit loop arranged to cover the substrate and provided with a first end that is electrically connected to a reference voltage and a second end that is electrically connected to the data input/output port of the RFID tag. The RFID chip generates a conductive code when the conducting circuit loop is originally conducting and generates a open-circuit code when the conducting circuit loop becomes open circuit resulting from the damage of the substrate in which both the conductive code and the open-circuit code are transmitted by the RFID transmitter and received by a RFID reader to determine the damage of the substrate.