The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2010
Filed:
Dec. 10, 2008
Ralph Thomas Hoctor, Saratoga Springs, NY (US);
Scott Stephen Zelakiewicz, Niskayuna, NY (US);
Evren Asma, Niskayuna, NY (US);
Jeffrey Gordon, Niskayuna, NY (US);
Floribertus P. M. Heukensfeldt Jansen, Ballston Lake, NY (US);
Ralph Thomas Hoctor, Saratoga Springs, NY (US);
Scott Stephen Zelakiewicz, Niskayuna, NY (US);
Evren Asma, Niskayuna, NY (US);
Jeffrey Gordon, Niskayuna, NY (US);
Floribertus P. M. Heukensfeldt Jansen, Ballston Lake, NY (US);
Morpho Detection, Inc., Newark, CA (US);
Abstract
An imaging system includes a platform having mounted thereon a coded-aperture imaging device and positioned to receive radiation over a baseline. The imaging system includes a computer configured to acquire a plurality of far-field datasets over the baseline, the plurality of far-field datasets comprising data received via the coded-aperture imaging device. The computer is also configured to form a preliminary image based on the acquired plurality of far-field datasets, and apply an expectation maximization (EM) algorithm to the preliminary image; wherein the EM algorithm includes an ordered subset algorithm.