The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2010

Filed:

Oct. 29, 2007
Applicants:

C. Harry Knowles, Moorestown, NJ (US);

Xiaoxun Zhu, Marlton, NJ (US);

Timothy Good, Clementon, NJ (US);

Tao Xian, Blackwood, NJ (US);

Anatoly Kotlarsky, Holland, PA (US);

Michael Veksland, Marlton, NJ (US);

Mark Hernandez, Bridgeton, NJ (US);

John Gardner, Mullica Hill, NJ (US);

Steven Essinger, Barnegat, NJ (US);

Patrick Giordano, Blackwood, NJ (US);

Sean Kearney, Hamilton, NJ (US);

Mark Schmidt, Williamstown, NJ (US);

John Furlong, Woodbury, NJ (US);

Nicholas Ciarlante, Woolwich Township, NJ (US);

Yong Liu, Suzhou, CN;

Jie Ren, Suzhou, CN;

Xi Tao, Suzhou, CN;

Jibin Liu, Suzhou, CN;

Ming Zhuo, Suzhou, CN;

Duane Ellis, Medford, NJ (US);

Inventors:

C. Harry Knowles, Moorestown, NJ (US);

Xiaoxun Zhu, Marlton, NJ (US);

Timothy Good, Clementon, NJ (US);

Tao Xian, Blackwood, NJ (US);

Anatoly Kotlarsky, Holland, PA (US);

Michael Veksland, Marlton, NJ (US);

Mark Hernandez, Bridgeton, NJ (US);

John Gardner, Mullica Hill, NJ (US);

Steven Essinger, Barnegat, NJ (US);

Patrick Giordano, Blackwood, NJ (US);

Sean Kearney, Hamilton, NJ (US);

Mark Schmidt, Williamstown, NJ (US);

John Furlong, Woodbury, NJ (US);

Nicholas Ciarlante, Woolwich Township, NJ (US);

Yong Liu, Suzhou, CN;

Jie Ren, Suzhou, CN;

Xi Tao, Suzhou, CN;

JiBin Liu, Suzhou, CN;

Ming Zhuo, Suzhou, CN;

Duane Ellis, Medford, NJ (US);

Assignee:

Metrologic Instruments, Inc., Blackwood, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 7/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A coplanar laser illumination and imaging subsystem deployable in an image capturing and processing system, and including an image formation and detection (IFD) subsystem having an image sensing array and optics providing a field of view (FOV) on the image sensing array, and forming an image of an object within the FOV and detecting said image on the image sensing array and producing a digital image thereof. The system includes a spectral-mixing based illumination subsystem having an array of VLDs for producing a visible illumination beam, and an array of infrared (IR) laser diodes (LDs) for producing an invisible illumination beam. The visible and invisible illumination beams spatially overlaps and spatially/temporally intermixes with each other to produce a composite spectrally-mixed illumination beam having a relative power ratio of visible illumination to invisible illumination (VIS/IR), and is substantially coplanar with the FOV of said image sensing array. A laser despeckling mechanism is provided for reducing the coherence of the composite spectrally-mixed illumination beam, and/or its components, so that the digital images produced by the IFD subsystem having substantially reduced levels of speckle-pattern noise when the laser despeckling mechanism is operational.


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