The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2010
Filed:
Jan. 24, 2007
Evanthia Papadopoulou, Baldwin Place, NY (US);
Sarah Braasch, Richmond, VT (US);
Mervyn Y. Tan, Hopewell Junction, NY (US);
Evanthia Papadopoulou, Baldwin Place, NY (US);
Sarah Braasch, Richmond, VT (US);
Mervyn Y. Tan, Hopewell Junction, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
In one embodiment, the present invention is a method and apparatus for net-aware critical area extraction. One embodiment of the inventive method for determining the critical area of an integrated circuit includes modeling a net corresponding to the integrated circuit as a graph, where the net is made up of a plurality of interconnected shapes spanning one or more layers of the integrated circuit. All generators for opens are then defined and identified. The Voronoi diagram of the identified generators is computed, and the critical area is computed in accordance with the Voronoi diagram.