The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7661052 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 09, 2010

Filed:

Jan. 29, 2008
Applicants:

Hayden C. Cranford, Jr., Cary, NC (US);

Vernon R. Norman, Cary, NC (US);

Martin L. Schmatz, Rueschlikon, CH;

Inventors:

Hayden C. Cranford, Jr., Cary, NC (US);

Vernon R. Norman, Cary, NC (US);

Martin L. Schmatz, Rueschlikon, CH;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/277 (2006.01); G06F 11/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for testing a high-speed circuit is disclosed. The method and system include obtaining a high-speed statistical signature of the high-speed circuit using a conventional tester. The method and system further include comparing the high-speed statistical signature of the high-speed circuit to an expected signature. Consequently, it can be determined whether the high-speed circuit functions within the desired parameters.


Find Patent Forward Citations

Cranford, Jr., Hayden. (2010). Using statistical signatures for testing high-speed circuits (U.S. Patent No. 7661052). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7661052

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