The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7661046 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 09, 2010

Filed:

Mar. 05, 2007
Applicants:

Dennis Martin Rickert, Rochester, MN (US);

Byron D. Scott, Rochester, MN (US);

Inventors:

Dennis Martin Rickert, Rochester, MN (US);

Byron D. Scott, Rochester, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); H03K 3/00 (2006.01); H03K 3/289 (2006.01); H03K 19/003 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and a Dual Interlocked Storage Cell (DICE) latch implementing enhanced testability includes an L1 latch and an L2 latch coupled to the L1 latch. Each L1 latch and each L2 latch includes redundant latch structures. A separate output is provided with the redundant L2 latch. The DICE latch includes a Redundant Test Latch Enable (RTLE) input. Each L1 latch and each L2 latch includes a path selector control in the redundant latch structures controlled by the RTLE input providing each of the redundant latch structures in a scan path during a test mode.


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