The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2010
Filed:
May. 20, 2005
Syed M. Ali, Menlo Park, CA (US);
Yury Kamen, Menlo Park, CA (US);
Deepak Alur, Fremont, CA (US);
John P. Crupi, Bethesda, MD (US);
Daniel B. Malks, Arlington, VA (US);
Syed M. Ali, Menlo Park, CA (US);
Yury Kamen, Menlo Park, CA (US);
Deepak Alur, Fremont, CA (US);
John P. Crupi, Bethesda, MD (US);
Daniel B. Malks, Arlington, VA (US);
Sun Microsystems, Inc., Santa Clara, CA (US);
Abstract
A method for analyzing a target system that includes obtaining a characteristics model, generating at least one selected from the group consisting of a schema, characteristics store API, and a characteristics extractor, using the characteristics model, obtaining a plurality of characteristics from the target system using characteristics extractor, wherein each of the plurality of characteristics is associated with the characteristics model, storing each of the plurality of characteristics in the characteristics store using the schema, and analyzing the target system by issuing at least one query to the characteristics store to obtain an analysis result.