The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 2010

Filed:

Mar. 19, 2002
Applicants:

Christopher A. Meek, Kirkland, WA (US);

David E. Heckerman, Bellevue, WA (US);

Robert L. Rounthwaite, Fall City, WA (US);

David Maxwell Chickering, Bellevue, WA (US);

BO Thiesson, Woodinville, WA (US);

Inventors:

Christopher A. Meek, Kirkland, WA (US);

David E. Heckerman, Bellevue, WA (US);

Robert L. Rounthwaite, Fall City, WA (US);

David Maxwell Chickering, Bellevue, WA (US);

Bo Thiesson, Woodinville, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and systems are disclosed for learning a regression decision graph model using a Bayesian model selection approach. In a disclosed aspect, the model structure and/or model parameters can be learned using a greedy search algorithm applied to grow the model so long as the model improves. This approach enables construction of a decision graph having a model structure that includes a plurality of leaves, at least one of which includes a non-trivial linear regression. The resulting model thus can be employed for forecasting, such as for time series data, which can include single or multi-step forecasting.


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