The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 2010

Filed:

Dec. 10, 2002
Applicants:

Satoshi Hirata, Hachioji, JP;

Satoshi Mitsuyama, Tokyo, JP;

Hitoshi Matsuo, Musashino, JP;

Shinichi Fukuzono, Hitachinaka, JP;

Hiroyuki Suzuki, Hitachinaka, KP;

Inventors:

Satoshi Hirata, Hachioji, JP;

Satoshi Mitsuyama, Tokyo, JP;

Hitoshi Matsuo, Musashino, JP;

Shinichi Fukuzono, Hitachinaka, JP;

Hiroyuki Suzuki, Hitachinaka, KP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

When the nucleic-acid base sequence of A, C, G, and T (or U) is determined by interpreting fluorescent-light intensity waveform data acquired by measuring nucleic-acid fragments, it is desirable to determine, with a high-accuracy, the base sequence at a location at which the data interpretation is difficult. In order to accomplish this object, the data interpretation is performed by making reference to information acquired by performing the statistical processing to plural pieces of fluorescent-light intensity waveform data corresponding to already-known base sequences. This method allows the determination of the nucleic-acid base sequence at the above-described location.


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