The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 2010

Filed:

Nov. 17, 2005
Applicants:

Michiel Schaap, Rotterdam, NL;

Karel Zuiderveld, Minnetonka, MN (US);

Inventors:

Michiel Schaap, Rotterdam, NL;

Karel Zuiderveld, Minnetonka, MN (US);

Assignee:

Vital Images, Inc., Minnetonka, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method including receiving data corresponding to an original three-dimensional (3D) reconstructed image, smoothing homogenous areas and enhancing edges of the original reconstructed image using edge enhancing diffusion (EED) to create edge-enhanced image data, and calculating a structural importance map. The structural importance map includes a measure of structural importance for each voxel of data in the original reconstructed image. Voxel intensities to be used to create a filtered image are determined according to at least one rule applied to the measure of structural importance.


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