The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 2010

Filed:

Aug. 08, 2006
Applicants:

Hiroya Kakimoto, Gunma, JP;

Fuyuki Miyazawa, Gunma, JP;

Mitsuo Sekiguchi, Gunma, JP;

Inventors:

Hiroya Kakimoto, Gunma, JP;

Fuyuki Miyazawa, Gunma, JP;

Mitsuo Sekiguchi, Gunma, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 19/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

In certain inventive aspects there are provided an optical recording method, an evaluation indicator acquiring method, an optical recording apparatus, and a CPU device, which can save a test time before recording information. An irradiation condition suitable for recording information on a first recording layer is extracted by recording and reproducing test information. The test information is recorded on and reproduced from a second recording layer. The irradiation condition suitable for recording information on the second recording layer is extracted on the basis of the test result for the first recording layer and the test result for the second recording layer. Accordingly, it is possible to save the test time for extracting the irradiation condition of the second recording layer.


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