The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2010
Filed:
Aug. 09, 2005
Marcus Feierabend, Heidelberg, DE;
Markus Rückel, Heidelberg, DE;
Winfried Denk, Heidelberg, DE;
Abstract
A method for sensing a wave-front of specimen light scattered from an illuminated area in a specimen () includes the steps of focusing illumination light into the specimen (), directing specimen light scattered in the specimen () to a detector device () having a plurality of detector elements () and being capable to sense light with local resolution, detecting sample light contained in the specimen light with the detector device (), said sample light being scattered in a predetermined sample plane () of the specimen () and being selected by a time-based gating of the specimen light, locally resolved measuring phase information of the sample light, and reconstructing the wave-front of the sample light on the basis of the phase information. Furthermore, a method of microscopic imaging with adapted illumination light is described.