The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2010
Filed:
Jan. 22, 2008
Xuefeng Wang, West Lafayette, IN (US);
David D. Nolte, Lafayette, IN (US);
Manoj Varma, Kerala, IN;
Brian Weichel, W. Lafayette, IN (US);
Timothy Norwood, Lafayette, IN (US);
Fouad Sayegh, West Lafayette, IN (US);
Ming Zhao, West Lafayette, IN (US);
Xuefeng Wang, West Lafayette, IN (US);
David D. Nolte, Lafayette, IN (US);
Manoj Varma, Kerala, IN;
Brian Weichel, W. Lafayette, IN (US);
Timothy Norwood, Lafayette, IN (US);
Fouad Sayegh, West Lafayette, IN (US);
Ming Zhao, West Lafayette, IN (US);
Purdue Research Foundation, West Lafayette, IN (US);
Abstract
A multi-modal data acquisition system for detecting target material on a biological reaction surface, the system comprising a radiation source for generating an incoming beam that impinges on the biological reaction surface at an oblique incidence angle and produces a reflected beam, an interferometric detector for detecting an interferometric signal from the illuminated surface, the reflected beam being directed to the interferometric detector, a fluorescence detector for detecting a fluorescence signal from the illuminated surface; the fluorescence detector being positioned to substantially minimize the incidence of the reflected beam; and a processing system for receiving the interferometric and fluorescence signals and determining the presence or absence of target material on the biological reaction surface. A reaction surface conditioned for the simultaneous collection of fluorescence, interferometric and other signals. A multi-modal data acquisition system for collecting and processing additional modes, including multiple interferometric, fluorescence and scattering channels.