The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2010
Filed:
May. 19, 2006
Shigeki Kobayashi, Chino, JP;
Shigeki Kobayashi, Chino, JP;
Seiko Epson Corporation, Tokyo, JP;
Abstract
To make it difficult to view streak unevenness in alignment generated at the boundary of alignment layers even when an alignment-layer material is applied onto a color-filter substrate several times to form an alignment layer. When an alignment-layer material is applied onto a color-filter substratehaving color filters (R, G, and B) on the surface with a droplet discharge headto form an alignment-layer train, the lateral front end Lof the trainis formed on the color filter (B) displaying blue. When the alignment-layer material is then applied to the following alignment-layer application train to form an alignment-layer train, the lateral rear end Lof the trainis overlapped with the lateral front end Lof the preceding alignment-layer trainto form an overlapped portion. Since the overlapped portionis formed on the color filter (B) displaying blue which has the lowest visibility of the three primary colors of light, streak unevenness in alignment generated at the boundary is difficult to view from the exterior.