The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2010
Filed:
Jan. 30, 2008
Applicants:
Curtis Lee Carrender, Morgan Hill, CA (US);
Mark A. Hadley, Newark, CA (US);
Inventors:
Curtis Lee Carrender, Morgan Hill, CA (US);
Mark A. Hadley, Newark, CA (US);
Assignee:
Alien Technology Corporation, Morgan Hill, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G08B 13/14 (2006.01); G06K 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and apparatus for testing RFID straps. Arrays of RFID straps in a roll-to-roll process are coupled to an array of test elements. RF programming and interrogation signals are frequency and time multiplexed to the RFID array. Return signals are detected to determine sensitivity and programmability parameters of the RFID straps.