The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 2010

Filed:

Aug. 03, 2007
Applicants:

Hiroaki Fujino, Kizugawa, JP;

Tetsuya Minamiguchi, Yamatokoriyama, JP;

Michihiro Nakahara, Yamatokoriyama, JP;

Takahiro Nakai, Tenri, JP;

Tomoaki Nakao, Yamatokoriyama, JP;

Inventors:

Hiroaki Fujino, Kizugawa, JP;

Tetsuya Minamiguchi, Yamatokoriyama, JP;

Michihiro Nakahara, Yamatokoriyama, JP;

Takahiro Nakai, Tenri, JP;

Tomoaki Nakao, Yamatokoriyama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03F 1/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one embodiment of the present invention, an operational amplifier circuit, a switching element is closed and a switching element is opened. A latch circuit DL latches an output voltage of an operational amplifier and supplies a Q output corresponding to the output voltage. A control circuit supplies an offset adjustment signal to an offset adjustment input terminal OR of the operational amplifier, thereby adjusting an offset of the output voltage. The latch circuit DL latches again the output voltage thus adjusted and minutely adjusts the offset adjustment signal so as to adjust the remaining offset. Weighting is carried out in accordance with how many times latching has been carried out, and the offset of the output voltage of the operational amplifier is quantized, thereby obtaining a binary logical signal and storing the signal in the control circuit.


Find Patent Forward Citations

Fujino, Hiroaki. (2010). Offset adjustment device, semiconductor device, display device, offset adjustment method, noise detection device, and noise detection method (U.S. Patent No. 7659777). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7659777

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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