The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7659712 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 09, 2010

Filed:

Oct. 13, 2004
Applicant:

Francisco M. Gutierrez, League City, TX (US);

Inventor:

Francisco M. Gutierrez, League City, TX (US);

Assignee:

Dresser, Inc., Addison, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 7/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

Process measurement may be achieved by systems and techniques generating output signals based on the measured process. In certain implementations, process measurement systems and techniques may include the ability to generate a magnetic field and successively change the orientation of the magnetic field. The systems and techniques may also include the ability to sense the presence of at least a first orientation of the magnetic field with a magnetic field sensor including a conductor and at least two Wiegand-effect conductors as the magnetic field orientation is changed and to generate an electrical pulse in the conductor with each Wiegand-effect conductor when the first orientation of the magnetic field is sensed.


Find Patent Forward Citations

Gutierrez, Francisco. (2010). System and method for process measurement (U.S. Patent No. 7659712). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7659712

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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