The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 09, 2010

Filed:

Jul. 18, 2007
Applicants:

Walter J. Dauksher, Fort Collins, CO (US);

Dennis H. Eaton, Loveland, CO (US);

Inventors:

Walter J. Dauksher, Fort Collins, CO (US);

Dennis H. Eaton, Loveland, CO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/40 (2006.01); H01L 23/48 (2006.01); H01L 23/485 (2006.01); H01L 23/52 (2006.01);
U.S. Cl.
CPC ...
Abstract

A design methodology reduces electromigration in integrated circuit joints such as flip-chip bumps by seeking to produce a more uniform current distribution at the interface between the integrated circuit pad and the joint while maintaining an interface form that coincides with standard integrated circuit designs is presented. The design methodology addresses the current distribution at the pad by dividing current carrying traces into a plurality of sub-traces with known resistances such that each sub-trace distributes a known amount of current to the pad of the integrated circuit. The multiple sub-traces connect to the pad and are placed to obtain a desired uniformity in the incoming current distribution. Width and/or length adjustments could be made to each of the plurality of sub-traces to obtain the desired resistances.


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