The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2010
Filed:
Oct. 03, 2007
Himanshu Goel, Ghaziabad, IN;
Amit Sharma, Agra, IN;
Himanshu Goel, Ghaziabad, IN;
Amit Sharma, Agra, IN;
Freescale Semiconductor, Inc., Austin, TX (US);
Abstract
A method and system for designing a test circuit in a System on Chip (SOC) includes identifying the test design constraints of the test circuit. The SOC is partitioned logically into a first set of logic blocks and a second set of logic blocks. A first set of scan chains is inserted in the first set of logic blocks, and a second set of scan chains is inserted in the second set of logic blocks, based on the test design constraints. Bypass circuits are inserted in the paths of the second set of scan chains, which are capable of bypassing at least one logic block of the second set of logic blocks during testing of the SOC.