The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2010
Filed:
Oct. 27, 2005
Jeong-seok Ha, Atlanta, GA (US);
Steven W. Mclaughlin, Decatur, GA (US);
Jaehong Kim, Seoul, KR;
Seung-bum Suh, Seoul, KR;
Jeong-Seok Ha, Atlanta, GA (US);
Steven W. McLaughlin, Decatur, GA (US);
Jaehong Kim, Seoul, KR;
Seung-Bum Suh, Seoul, KR;
Samsung Electronics Co., Ltd., , KR;
Georgia Tech Research Corporation, Atlanta, GA (US);
Abstract
A method for puncturing a low density parity check (LDPC) code that is decoded through a parity check matrix expressed by a factor graph including check nodes and bit nodes connected to the check nodes through edges. The method includes classifying the bit nodes mapped to a parity part of a codeword into hierarchical groups according to their decoding facilities when the bit nodes are punctured, determining puncturing order of the groups, and sequentially performing puncturing on the bit nodes from a bit node belonging to a corresponding group according to the puncturing order of the groups to acquire a codeword with a desired coding rate.