The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 2010
Filed:
Jun. 10, 2005
Peter Gerber, Woodinville, WA (US);
Jing Tan, Bellevue, WA (US);
Michael Robinson, Bellevue, WA (US);
Peter Gerber, Woodinville, WA (US);
Jing Tan, Bellevue, WA (US);
Michael Robinson, Bellevue, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
An integrated test framework is disclosed that allows software testers to easily generate and execute tests of software involving multiple interacting computer systems. A copy of the integrated test framework resides on each computer system in the test. The integrated test framework on each computer system supports the independent testing of software on that system and also the synchronization between the computer systems. A test manager is provided to coordinate the synchronization. All the information necessary to direct the test framework on each of the computer systems is included within a single test script that is propagated to and executed on each computer system. The test script dictates the role of each computer system within the test and includes role specific actions and identifies points at which the computer systems must synchronize together for the passing of data, messages or other communications.