The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 2010

Filed:

Nov. 29, 2005
Applicants:

Graham Cormode, Summit, NJ (US);

Phillip Korn, New York, NY (US);

Shanmugavelayutham Muthukrishnan, Washington, DC (US);

Divesh Srivastava, Summit, NJ (US);

Inventors:

Graham Cormode, Summit, NJ (US);

Phillip Korn, New York, NY (US);

Shanmugavelayutham Muthukrishnan, Washington, DC (US);

Divesh Srivastava, Summit, NJ (US);

Assignee:

AT&T Corp., New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Described is a system and method for receiving a data stream of multi-dimensional items, collecting a sample of the data stream having a predetermined number of items and dividing the sample into a plurality of subsamples, each subsample corresponding to a single dimension of each of the predetermined number of items. A query is then executed on a particular item in at least two of the subsamples to generate data for the corresponding subsample. This data is combined into a single value.


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